Products

Add-on Tools

Extend your microscope with heating and cooling stages, current amplifiers, a rotary nano-lathe and an in-chamber camera.

A strip of five current-contrast example images labelled EBIC, EBAC, RCI, EBIRCH and EBIV — false-colour defect maps overlaid on SEM views of semiconductor structures.
EBIC

EBIC Amplifier

A low-noise current amplifier that turns the electron beam into a defect-mapping tool — EBIC, EBAC, RCI, EBIRCH and EBIV from a single unit.

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The MHCS micro heating and cooling stage — a cylindrical aluminium stage on a round flanged base ringed with brass fixing screws.
MHCS

Micro Heating & Cooling Stage MHCS

A water-cooling-free micro heating and cooling stage — drive −60 °C to +125 °C temperature profiles on the sample, vibration-free.

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The MHS micro heating stage — a small cylindrical stage with a braided copper thermal strap, on a white background.
MHS

Micro Heating Stage MHS

A miniaturized heating stage with closed-loop control — up to 200 °C, or 450 °C with the MHS450 variant.

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The nanolathe — a machined aluminium rotational-axis unit with a vertical collet at the top holding a fine needle sample upright.
RT-LATHE

Nanolathe (RT-LATHE)

A stand-alone rotational axis for true FIB lathe milling and tomography — spin a region of interest concentrically under the beam.

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Three SpringTable force-measurement devices of different sizes, each machined in aluminium with a copper spring strip engraved with its spring constant (for example 11.5 N/m and 125 N/m).
STFMA

SpringTable & Force Measurement Analysis

A low-tech SpringTable that converts the SEM's own resolution into quantitative force–distance curves.

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An in-chamber view of two Kleindiek micromanipulators flanking a central sample pillar, with the SemCam camera module viewing from the upper right.
SemCam

SemCam

An in-chamber CCD camera that watches the probe approach from the side — land tips in under thirty seconds.

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